Multichannel flaw detector USIP|xs CV

ultrasonicdigitalfor aeronautics

The improved multi-instrument architecture provides more flexibility and helps you to optimize your automation capabilities. As the successor of the USIP 40 multi-channel flaw detector, the newly available Krautkrämer USIP|xs CV solves a growing need for easy, cost-effective integration. The improved multi-instrument architecture helps to optimize automation capabilities and provides more interfaces and flexibility. The USIP|xs CV can be integrated into any automated and semi-automated inspection system. With different T/R specifications and multitude of channel configurations, the instrument is scalable in performance as well as associated cost. As a result, it is well suited for a wide range of applications and system sized, such as Quality Assurance, Press Control and R&D. Best automation capabilities Effective integration into automated systems of any complexity Integrated field bus connection enables for a single cable connection ton any PLC & significantly reduces wiring efforts when designing larger systems Synergies of a scalable platform Perfectly fitted to the individual customer need Creates synergies concerning: technical infrastructures, Training/Integration know-how, Life cycle support, spare parts handling Ease of use and operation Latest usability standards, vast integrated diagnostics features: reduced training, learning efforts, fast start up and maintenance Integrated box design superior to slot card design systems: widely reduces number of parts and interfaces, reduced probability of failure Plug and play - TÜV approved EMC and Safety: saves time, risk and cost compared to UT PCB suppliers