Ultrasonic ultrasonic transducer B 1 S
contactbeamsurface

Ultrasonic ultrasonic transducer - B 1 S - Waygate Technologies - contact / beam / surface
Ultrasonic ultrasonic transducer - B 1 S - Waygate Technologies - contact / beam / surface
Ultrasonic ultrasonic transducer - B 1 S - Waygate Technologies - contact / beam / surface - image - 2
Ultrasonic ultrasonic transducer - B 1 S - Waygate Technologies - contact / beam / surface - image - 3
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Characteristics

Technology
contact, surface, ultrasonic, beam, scanning
Applications
angle beam
Frequency

Min.: 1 MHz

Max.: 10 MHz

Description

Krautkramer Ultrasonic Probes & Transducers Waygate's line of Krautkramer ultrasonic contact transducers and probes are built to last, easy to use and most of all, one of the most accurate ultrasonic testing tools on the market. This means you get better results, every time. We offer many different types of contact probes including multiple straight beam single element, straight beam dual element and angle beam options. Straight Beam Single Element Probes Straight Beam Dual Element Probes Angle Beam Probes We used to be GE Inspection Technologies, now we’re Waygate Technologies, a global leader in NDT solutions with more than 125 years of experience in ensuring quality, safety and productivity. See all of the contact probes we offer Typically used for manual inspections, straight beam single element transducers are ideal for scanning parts with regular geometry and relatively smooth contact surfaces. This includes flat or curved surfaces where you need to identify flaws or a backwall parallel to the surface or detect with a beam normal to the surface. With improved near surface resolution, you can use these probes along with a couplant layer (typically gel, oil, or paste) when you need to penetrate a thick section of material. Straight beam dual element (TR) transducers are best for manually scanning thin sections of material when looking for flaws or backwalls parallel to or those which are detectable with a beam normal to the surface. With excellent near surface resolution and reduced noise caused by scattering, these probes transmit and receive elements separated by a crosstalk barrier.

Exhibitions

Meet this supplier at the following exhibition(s):

Formnext Chicago
Formnext Chicago

8-10 Apr 2025 Chicago (USA - Illinois)

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