X-ray inspection system Phoenix V|tome|x L 300
for the aeronautical industry3D2D

X-ray inspection system - Phoenix V|tome|x L  300 - Waygate Technologies - for the aeronautical industry / 3D / 2D
X-ray inspection system - Phoenix V|tome|x L  300 - Waygate Technologies - for the aeronautical industry / 3D / 2D
X-ray inspection system - Phoenix V|tome|x L  300 - Waygate Technologies - for the aeronautical industry / 3D / 2D - image - 2
Add to favorites
Compare this product
 

Characteristics

Technology
X-ray
Applications
for the aeronautical industry
Other characteristics
3D, 2D

Description

Highly flexible CT scanner to detect flaws and voids in composites, castings and pecision AM parts The Phoenix V|tome|x L 300 is a versatile high-resolution walk-in cabinet microfocus system with nanoCT® option for 3D computed tomography (structure failure analysis & metrology) and 2D non-destructive X-ray inspection. The Phoenix V|tome|x L 300 system is equipped with a unipolar 300 kV/500 W microfocus source and optional nano CT capability in Dual|tube combination with a 180kV/20W high-power nanofocus X-ray tube for best detail detactability of 2.0 µm. The CT-scanner handles large samples up to 50 kg and up to 600 mm in diameter with extremely high precision. The system is a great flexible solution for void and flaw detection of composites, castings and precision parts, e.g. additive manufactured parts or turbine blades. It allows also high precision 3D metrology conform to VDI/VDE 2630-1.3. Benefits Unique Benefits: Micro- and nanoCT Scanning at the limits of sample size and density (to 50 kg and up to 600 mm in diameter) Great flexibility for 2D and 3D inspection on a wide application range Features Some of the Phoenix V|tome|x L 300 features are: Fast CT acquisition and brilliant images by next generation highly sensitive Dynamic 41 detectors Leading exclusive Waygate Technologies core components such as X-ray tubes, detectors, software Patented optional features such as High-flux|target or Scatter|correct technology - Leading measurement accuracy of SD ≤ (6.8 ± L/100 mm) µm referring to VDI/VDE 2630-1.3 for i.e. reliable revalidation of system performance

Exhibitions

Meet this supplier at the following exhibition(s):

Formnext Chicago
Formnext Chicago

8-10 Apr 2025 Chicago (USA - Illinois)

  • More information

    Other Waygate Technologies products

    Other products

    *Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.