Coating thickness gauge EddyCus® TF map 2530MT

non-contactfor aeronauticseddy current

The Eddy­Cus® TF map 2530 Series auto­mat­ic­ally meas­ures the sheet res­ist­ance of large samples up to 300 x 300 mm² (12 x 12 inches) in non-con­tact mode. Upon manu­al sample po­s­i­tion­ing the device auto­mat­ic­ally meas­ures and dis­plays an ac­cur­ate map­ping of the sheet res­ist­ance across the en­tire sample area. The meas­ure­ment set­tings al­low eas­ily and flex­ibly to choose between fast meas­ure­ment times of be­low 1 minute or high spa­tial meas­ure­ment res­ol­u­tion of more than 100,000 meas­ure­ment points. Highlights Non-contact Fast and precise measurement High resolution mapping of conductive thin films Imaging of substrates up to 300 x 300 mm (12 x 12 inches) Characterization even of hidden and encapsulated conductive layers Various software-integrated analysis functions (e.g. sheet resistance distribution, line scans, single point analysis) Measurement data saving and export functions Defect detection and coating analysis Types The device platform is available in different sensor configurations including eddy current sensors for electrical characterization or sensors for optical characterization. Variants of the measurement configurations involve the following options. Characteristics Technology: non-contact eddy current Imaging by multipoint mapping Positioning area: 300 mm x 300 mm Sampling area: 300 x 300 mm Recommended sample sizes: 1 inch to 12 inch or 25 to 300 mm Software and Device Control Very user-friendly software Realtime mapping measurement Easy-to-use statistical analysis options Pre-defined measurement and product recipes (sizes, pitches, thresholds) Line scan, histogram and area analysis Black and colored image coding