Glass thickness gauge EddyCus® TF lab 4040SR

filmnon-contactfor aeronautics

The EddyCus® TF lab 4040 Series is dedicated to non-contact single point measurements on medium sized substrates. The flexibly applicable bench-top device allows depending of its setup the precise manual measurement of sheet resistance, metal thickness, optical transparency or electrical (an)isotropy. Most common applications include the measurement of thin conductive transparent and non-transparent layers, wafers or metal sheets. Highlights Non-contact, real time, robust Accurate and very repeatable measurements High measurement quality without influence of: Homogeneous contact quality Passivation / Encapsulation Roughness No harm to sensitive layers Precise measurement of Conventional conductive thin-films Grids and wire structures Multi-layer systems Hidden and encapsulated conductive layers No wearing Software guided manual mapping for systematic quality assurance Many measurement data saving and export functions Space saving smart monitor integration (for measurement per touch screen and data evaluation) Software development kit test automation using customer programs Types The device can be equipped with different sensors including eddy current sensors for electrical characterization or sensors for optical characterization. Variants of the device platform involve the following options.