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Phased array flaw detector Surftest SJ-210
programmablefor aeronautics

Phased array flaw detector - Surftest SJ-210   - Mitutoyo Europe - programmable / for aeronautics
Phased array flaw detector - Surftest SJ-210   - Mitutoyo Europe - programmable / for aeronautics
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Phased array flaw detector - Surftest SJ-210   - Mitutoyo Europe - programmable / for aeronautics - image - 3
Phased array flaw detector - Surftest SJ-210   - Mitutoyo Europe - programmable / for aeronautics - image - 4
Phased array flaw detector - Surftest SJ-210   - Mitutoyo Europe - programmable / for aeronautics - image - 5
Phased array flaw detector - Surftest SJ-210   - Mitutoyo Europe - programmable / for aeronautics - image - 6
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Characteristics

Technology
phased array
Options and accessories
programmable
Applications
for aeronautics

Description

This is a portable measuring instrument that allows you to easily and accurately measure surface roughness. The Surftest SJ-210 offers you the following benefits: Skid system gives you user friendly and intuitive menu navigation. It works independently of mains power, allowing you to make on-site measurements. The 6.0 cm [2.4 colour graphic, back-lit LCD gives you excellent readability. It performs roughness analyses conform to various international standards (EN ISO, VDA, ANSI, JIS) and customized settings. Different drivers expanding the range of applications. Calculation results, assessed profiles, bearing and amplitude curves can be displayed. Support of 21 languages. Operation by keys on the front and under the sliding cover. Detector measuring force: 0.75 mN Stylus tip angle: 60° Stylus tip radius: 2 µm Mass: 500 g Measuring range: 16 mm, 4.8 mm [S-type] Traverse: 17.5 mm, 5.6 mm [S-type] Measuring speed: 0.25 mm/s; 0.5 mm/s; 0.75 mm/s Cable length: 1 m Measuring method: Differential inductance Range: 360 µm Stylus: Diamond Tip Skid radius: 40 mm Profiles: Roughness Profile (R), R-Motif, DF-Profile and more Display range: Ra, Rq: 0.01 µm - 100 µm Ry, Rz, Rt, R3z, Rvk, Rpk, Rk, Rp: 0.02 µm - 350 µm Vo: 0 - 10 (mm3/cm2) S, Sm: 2 µm - 4000 µm Pc: 2.5/cm - 5000/cm Mr 1, Mr 2: 0 - 100 % mr: 1 - 100 % Roughness standard: EN ISO, VDA, JIS, ANSI and customize settings Sampling length (L): 0.25 mm, 0.8 mm, 2.5 mm

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Exhibitions

Meet this supplier at the following exhibition(s):

Hyvolution 2025
Hyvolution 2025

28-30 Jan 2025 paris (France) Stand 6B40

*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.