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Scanning touch probe SP-80 CMMfor aeronautics
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Characteristics
- Technology
- scanning
- Applications
- CMM
- Other characteristics
- for aeronautics
Description
Scanning probes can acquire several hundred surface points each second, enabling measurement of form as well as size and position.
Scanning probes can also be used to acquire discrete points in a similar way to touch-trigger probes.
A range of solutions is available, suitable for all sizes and configurations of CMM.
Catalogs
No catalogs are available for this product.
See all of Mitutoyo Europe‘s catalogsExhibitions
Meet this supplier at the following exhibition(s):
Hyvolution 2025
28-30 Jan 2025 paris (France) Stand 6B40
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.