XRF analyzer FT2 Series

materialbenchtopfor aeronautics

The FT200 Series benchtop XRF analyzers have been designed to significantly reduce the time taken to make a measurement. Recognizing that the most time is taken with sample setup and measurement recipe selection, engineers at Hitachi have created a series of ground-breaking analyzers that effectively ‘set up’ themselves, making it possible to analyze many more parts within a single shift. Automation and innovative software are what make the FT230 and FT210 analyzers. Smart Recognition modules such as Find My Part™ mean that all the operator needs to do is load the sample, confirm the part and the instrument takes care of the rest. It will find the right measurement locations on your part – even on large substrates – select the correct analysis program and send the results to your quality system. Time and human error are reduced, and you get more analysis done in less time, making 100% inspection much more realistic in a busy production environment. Product Highlights Every single element of the FT230 and FT210 has been designed to drastically reduce analysis time. Automated focusing reduces sample loading time Find My Part™ smart recognition automatically sets the complete measurement routine Sample view is presented over a large part of the screen for excellent visibility Self-checking diagnostics confirms the health and stability of the instrument Integrates seamlessly with other software and easily exports data Intuitive and easy to use by non-specialists thanks to a new user interface Powerful to measure up to four layers at once plus the substrate Durable for a long-life in a challenging production or lab environment Conforms to ASTM B568 and DIN ISO 3497