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XRF analyzer FT110A
materialbenchtopfor aeronautics

XRF analyzer - FT110A - Hitachi High-Tech Analytical Science - material / benchtop / for aeronautics
XRF analyzer - FT110A - Hitachi High-Tech Analytical Science - material / benchtop / for aeronautics
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Characteristics

Other characteristics
material
Configuration
benchtop
Other characteristics
for aeronautics, XRF

Description

The FT110A is a benchtop XRF analyzer designed to meet the challenges of in-production coatings analysis. Powerful X-ray fluorescence technology coupled with automated positioning functionality helps to increase productivity of plating shops while ensuring components meet the highest standards. Accuracy and reliability are central to XRF analysis that supports quality control, and the FT110A delivers the accuracy that today’s plated components need. An updated imaging system, automated sample positioning and a large sample stage make this analyzer very easy to use, increasing throughput and reducing human error. With the capability of measuring up to four layers at once, plus the substrate, the powerful FT110A will support your facility round the Product Highlights Designed for high-throughput production, here’s how the FT110A can support your quality control. Powerful, high-sensitivity technology delivers results in seconds Non-destructive testing safe for finished goods Automated features increase productivity Analyze up to four layers and the substrate, plus bath solution Easy to use by non-specialist operators Measurement methods meets ISO 3497, ASTM B568 and DIN 50987 Large chamber accommodates a wide range of samples Customizable options to suit your application

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.