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Phased array flaw detector OmniScan® X3 64
imagingtotal focusing methodfor aeronautics

phased array flaw detector
phased array flaw detector
phased array flaw detector
phased array flaw detector
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Characteristics

Technology
phased array, imaging, total focusing method
Applications
for aeronautics, for the aerospace industry

Description

Power You Can Carry Housed in the field-proven rugged and portable OmniScan X3 enclosure, the OmniScan X3 64 flaw detector’s powerful focusing capabilities supported by its larger element-aperture capacity enable you to fully exploit 64-element phased array probes and 128-element aperture TFM. Utilize its enhanced performance to meet the inspection challenges of thick and attenuative materials and expand your potential to develop new procedures for a wider range of applications. FAQs about the Open File Format NDEer With the release of MXU 5.11 onboard software for OmniScan™ X3 and X3 64 flaw detectors, the file format of data files created with these devices has changed from .odat to .nde. This change is the beginning of a shift in how NDT data is managed and accessed. It starts with the OmniScan X3 series but will be applied to all future Evident nondestructive testing software and hardware platforms, and hopefully it will be extended to and used by the entire NDT industry. Save Time and Energy Screening Welds with the Merged B-Scan If you’ve ever wondered whether there’s a more efficient way to perform weld screening than simply scrolling through B-scans, you’ll want to hear about our solution. With the MXU 5.13 software update, we introduced an innovative B-scan view for the OmniScan™ X3 series that has the potential to revolutionize this time- and attention-consuming technique. Used as a validation tool, it can give you more confidence in your assessments and help ease the whole B-scan screening process. 5 Main Advantages of Phase Coherence Imaging (PCI)

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