Laser diode testing machine

performanceaeronautical

Reliability test system for laser diode qualification in pulsed or CW regime Life-test and qualification test system for laser diode reliability evaluation in CW or pulsed regime down to 1 nanosecond. Up to 112 fully independent fibered devices are electrically, thermally and optically tested according to several user-programmed test scenario. This laser diode reliability test system has been specially designed for the qualification and test of fiber-coupled devices with maximum of internal and external measurement flexibility. The laser diode optical power is measured independently from the BFMs or some external photodiodes with variable gain for a better precision. It allows for the independent and precise adjustment of the temperature of each laser diode package and each laser diode chip. his laser diode reliability test system is a short-pulsed-compatible reliability evaluation system ideal for life-test and qualification testing. Key Features : From CW (Continuous Wave) down to less than 1 ns pulse width CW-LIV and Pulsed-LIV testing to avoid thermal effects 100% independent behavior of each laser diode Ideal for Butterfly or other fiber coupled packages (Mini-Butterfly, TOSA, TO-Can etc.) Embedded flash memory in each tray of 8 laser diodes Programming supervisory GUI with easy-to-use graphical interface Full laser protection with special protective window Applications of this laser diode reliability test system includes any qualifications, life-test or Burn-in tests : In parallel with the production process for R&D and Qualification teams At the end of the laser diode production process