Phased-Array-Fehlerdetektor OmniScan X4

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Das leistungsstarke und portable OmniScan X4 Multitechnologie-Prüfgerät ermöglicht die Erkennung und Interpretation von komplexen Fehlern sowie eine frühzeitige Identifizierung von Schäden. Detect and Define Smaller HTHA Cracks Detecting HTHA early and reliably is so challenging that multiple inspection methods are often used in conjunction to maximize the probability of detection. Time-of-flight diffraction (TOFD), along with focused phased array (PA) and the total focusing method (TFM), especially using Dual Linear Array™ (DLA) probes, have shown to be particularly effective inspection techniques for this application. OmniScan™ X4 flaw detector fully supports these methods, as well as innovative phase coherence imaging (PCI), which enhances small flaws and crack tips. OmniScan X4 instruments also offer a variety of onboard software tools to ease your setup and analysis workflow. •Integrated DLA probe configuration and scanner configuration •High-resolution TFM images (up to 1024 × 1024 points) •Software tools to optimize the TFM inspection process, from setup to analysis (scan plan with AIM model, automatic TCG, sparse firing, soft gain and palette slider, live TFM envelope and image filters, gates, and alarms) •64-element TFM aperture and 128-element extended TFM aperture (OmniScan X4 64:128PR model) •Phase coherence imaging to enhance small defects and crack tips (all OmniScan X4 units) •Acquire up to 8 TOFD and phased array groups simultaneously for efficient screening •Acquire and display up to 4 TFM and PCI groups at once •Plane wave imaging (PWI) available with TFM and PCI (using the OmniScan X4 unit with linear array probes)